Sodium and hydrogen analysis of room temperature glass corrosion using low energy Cs SIMSFEARN, S; MCPHAIL, D. S; MORRIS, R. J. H et al.Applied surface science. 2006, Vol 252, Num 19, pp 7070-7073, issn 0169-4332, 4 p.Conference Paper

Depth profiling of NbxO/W multilayers: effect of primary ion beam species (O2+, Ar⁺ and Cs⁺)HE, A; XU, S; FOROUGHI-ABARI, A et al.Surface and interface analysis. 2012, Vol 44, Num 8, pp 934-937, issn 0142-2421, 4 p.Conference Paper

Influence of nonstationary atomic mixing on depth resolution in sputter depth profilingWANG, J. Y; LIU, Y; HOFMANN, S et al.Surface and interface analysis. 2012, Vol 44, Num 5, pp 569-572, issn 0142-2421, 4 p.Article

Unique reconstruction of depth profiles in neutron specular reflectometry: practical aspectsLEEB, H; JERICHA, E; KASPER, J et al.Physica. B, Condensed matter. 2005, Vol 356, Num 1-4, pp 41-45, issn 0921-4526, 5 p.Conference Paper

Analysis of simulated hypervelocity impacts on a titanium fuel tank from the Salyut 7 space stationJANTOU, V; MCPHAIL, D. S; CHATER, R. J et al.Applied surface science. 2006, Vol 252, Num 19, pp 7120-7123, issn 0169-4332, 4 p.Conference Paper

Origin of differences between MCs⁺ and MCs⁺₂ SIMS depth profilesMIYAMOTO, Takashi; NUMAO, Shigenori; HASEGAWA, Takahiro et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 101-102, issn 0142-2421, 2 p.Conference Paper

Comparison of urban and rural particulate air pollution characteristics obtained by SIMS and SSMSKONARSKI, P; HAŁUSZKA, J; CWIL, M et al.Applied surface science. 2006, Vol 252, Num 19, pp 7010-7013, issn 0169-4332, 4 p.Conference Paper

An investigation of the distribution of minor components in complex polymeric paint formulations using ToF-SIMS depth profilingHINDER, Steven J; WATTS, John F; SIMMONS, Garnett C et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 436-440, issn 0142-2421, 5 p.Conference Paper

Latest developments for the CAMECA ULE-SIMS instruments: IMS Wf and SC-UltraDE CHAMBOST, E; MERKULOV, A; PERES, P et al.Applied surface science. 2004, Vol 231-32, pp 949-953, issn 0169-4332, 5 p.Conference Paper

Advanced in Auger microanalysis for semiconductor technologyPAMLER, W.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 331-337, issn 0142-2421Conference Paper

Nature of noise in SIMS depth profiling dataMAKAROV, V. V.Surface and interface analysis. 1999, Vol 27, Num 9, pp 801-804, issn 0142-2421Article

Scattering by randomly rough dielectric surfaces and rough dielectric films : influence of the height distribution : Electromagnetic opticsCALVO-PEREZ, O; GREFFET, J. J; SENTENAC, A et al.Journal of optics. A, Pure and applied optics (Print). 1999, Vol 1, Num 4, pp 560-565, issn 1464-4258Conference Paper

Hadrons and other secondaries generated by cosmic-ray muons undergroundKHALCHUKOV, F. F; KOROLKOVA, E. V; KUDRYAVTSEV, V. A et al.Nuovo cimento della società italiana di fisica. C. 1995, Vol 18, Num 5, pp 517-529, issn 0390-5551Article

Investigation of pulsation characteristics of magnetic field at various depths within the relaxation zoneROMANOV, V. A; ROMANOV, D. V.Astronomičeskij žurnal. 1993, Vol 70, Num 4, pp 887-894, issn 0004-6299Article

Approaching the limits of high resolution depth profilingHOFMANN, S.Applied surface science. 1993, Vol 70-71, Num 1-4, pp 9-19, issn 0169-4332, AConference Paper

Surface structure of cationic surfactant solutions investigated by angular resolved X-ray photoelectron spectroscopy with calibrated transmission functionWANG, Chuangye; MORGNER, Harald.Surface and interface analysis. 2011, Vol 43, Num 4, pp 784-790, issn 0142-2421, 7 p.Article

Effect of primary oxygen ion implantation on SIMS depth profiling in glassesTULETA, Marek.Applied surface science. 2006, Vol 252, Num 18, pp 6107-6110, issn 0169-4332, 4 p.Conference Paper

SIMS depth profiling of deuterium labeled polymers in polymer multilayersHARTON, Shane E; STEVIE, Fred A; GRIFFIS, Dieter P et al.Applied surface science. 2006, Vol 252, Num 19, pp 7224-7227, issn 0169-4332, 4 p.Conference Paper

Combined AES and TOF-SIMS analysis of a thermally treated Ag/Ti/Al metallization systemSCHEITHAUER, U; TREICHLER, R.Surface and interface analysis. 2006, Vol 38, Num 4, pp 296-299, issn 0142-2421, 4 p.Conference Paper

Applications of SIMS to cultural heritage studiesADRIAENS, A; DOWSETT, M. G.Applied surface science. 2006, Vol 252, Num 19, pp 7096-7101, issn 0169-4332, 6 p.Conference Paper

Depth profiling of emerging materials for semiconductor devicesRONSHEIM, P. A.Applied surface science. 2006, Vol 252, Num 19, pp 7201-7204, issn 0169-4332, 4 p.Conference Paper

Some applications of SIMS in conservation science, archaeometry and cosmochemistryMCPHAIL, D. S.Applied surface science. 2006, Vol 252, Num 19, pp 7107-7112, issn 0169-4332, 6 p.Conference Paper

Nondestructive in-depth composition profile of oxy-hydroxide nanolayers on iron surfaces from ARXPS measurementOLLA, Maurizio; NAVARRA, Gabriele; ELSENER, Bernhard et al.Surface and interface analysis. 2006, Vol 38, Num 5, pp 964-974, issn 0142-2421, 11 p.Article

Fine-tuned profile simulation of holographically exposed photoresist gratingsZANKE, C; GOMBERT, A; ERDMANN, A et al.Optics communications. 1998, Vol 154, Num 1-3, pp 109-118, issn 0030-4018Article

Characterization of quasi-rugate filters using ellipsometric measurementsTIKHONRAVOV, A. V; TRUBETSKOV, M. K; HRDINA, J et al.Thin solid films. 1996, Vol 277, Num 1-2, pp 83-89, issn 0040-6090Article